12 results
Les Formes du Puceron du Pois dans le Sud du Québec1
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- Journal:
- The Canadian Entomologist / Volume 95 / Issue 5 / May 1963
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- 31 May 2012, pp. 558-560
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Factors in Resistance of Peas to the Pea Aphid, Acyrthosiphon pisum (Harr.) (Homoptera: Aphididae). II. Amino Acids1
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- Journal:
- The Canadian Entomologist / Volume 89 / Issue 10 / October 1957
- Published online by Cambridge University Press:
- 31 May 2012, pp. 457-464
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L'Élevage du Puceron du Pois sur une Diète Artificielle de Composition Chimique Connue
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- Journal:
- The Canadian Entomologist / Volume 96 / Issue 1-2 / February 1964
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- 31 May 2012, p. 99
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Les Races du Puceron du Pois
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- The Canadian Entomologist / Volume 96 / Issue 1-2 / February 1964
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- 31 May 2012, pp. 107-108
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Biotypes of Pea Aphid Acyrthosiphon pisum (Harris) in Relation to Alfalfa Clones1
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- Journal:
- The Canadian Entomologist / Volume 97 / Issue 7 / July 1965
- Published online by Cambridge University Press:
- 31 May 2012, pp. 754-760
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Growth, Reproduction and Longevity in one Biotype of the Pea Aphid, Acyrthosiphon pisum (Harr.) (Homoptera: Aphididae)
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- Journal:
- The Canadian Entomologist / Volume 92 / Issue 10 / October 1960
- Published online by Cambridge University Press:
- 31 May 2012, pp. 762-764
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Strained Silicon On Insulator wafers made by the Smart Cut™ technology
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- Journal:
- MRS Online Proceedings Library Archive / Volume 809 / 2004
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- 17 March 2011, B2.3
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- 2004
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ALD HfO2 surface preparation study
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- Journal:
- MRS Online Proceedings Library Archive / Volume 745 / 2002
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- 11 February 2011, N5.11
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- 2002
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The Influence of Defects on Compatibility and Yield of the HfO2-PolySilicon Gate Stack for CMOS Integration
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- Journal:
- MRS Online Proceedings Library Archive / Volume 747 / 2002
- Published online by Cambridge University Press:
- 11 February 2011, T6.7/N8.7
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- 2002
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The Influence of Defects on Compatibility and Yield of the HfO2-PolySilicon Gate Stack for CMOS Integration
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- Journal:
- MRS Online Proceedings Library Archive / Volume 745 / 2002
- Published online by Cambridge University Press:
- 11 February 2011, N8.7/T6.7
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- 2002
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Impact Ionization, Degradation, and Breakdown in SiO2
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- Journal:
- MRS Online Proceedings Library Archive / Volume 284 / 1992
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- 22 February 2011, 219
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- 1992
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Electron beam Annealing of Shallow BF2 Implantations
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- Journal:
- MRS Online Proceedings Library Archive / Volume 23 / 1983
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- 22 February 2011, 309
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- 1983
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